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SEMI G69-0996 © SEMI 1996, 2004 16 NOTICE: SEMI makes no warranties or representations as to the suitability o f the standard set forth herei n for any pa rticular application. The determination of the suitability o f th…

15 SEMI G69-0996 © SEMI 1996, 2004
APPENDIX 4
LEADFRAME DESIGN FOR PULL METHOD
NOTICE: The material in this appendix is an official part of SEMI G69 and was approved by full letter ballot
procedures.
Figure A1-4

SEMI G69-0996 © SEMI 1996, 2004 16
NOTICE: SEMI makes no warranties or
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forth herein for any particular application. The
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1 SEMI G70-0996 © SEMI 1996, 2004
SEMI G70-0996 (Reapproved 1104)
STANDARD FOR EQUIPMENT AND LEADFRAME FIXTURES FOR
MEASUREMENT OF PLASTIC PACKAGE LEADFRAMES
This standard was technically approved by the Global Assembly & Packaging Committee and is the direct
responsibility of the Japanese Packaging Committee. Current edition approved by the Japanese Regional
Standards Committee on July 23, 2004. Initially available at www.semi.org September 2004; to be published
November 2004. Originally published in 1996.
1 Purpose
1.1 This standard describes the equipment and
leadframe fixtures used for measurement of Z-axis
dimensions of plastic package leadframes.
2 Scope
2.1 This standard mainly describes the equipment and
leadframe fixture for measurement of leadframes that
are 0.15 mm in thickness as used for TSOP and TQFP
packages listed in group II in Table 1.
2.2 This standard also may be applied for leadframe of
conventional packages which are 0.2 mm in
thickness.
Table 1 Package Classification
Group I Group II
SSOP
DIP TSOP
ZIP TSSOP
SOJ QFP
SOP TQFP
QFJ (PLCC) LQFP
SVP
NOTE 1: Packages should be classified by EIAJ and JEDEC
specifications.
NOTICE: This standard does not purport to address
safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory or other limitations prior
to use.
3 Referenced Standards
3.1 SEMI Standard
SEMI G57 — Guideline for Standardization of
Leadframe Terminology
3.2 EIAJ Standard
1
ED-7411 — General Rules for the Preparation of
Outline Drawings of Integrated Circuits, Packages
Name and Code
3.3 JEDEC Specifications
2
Pub. No. 95 — Registered and Standard Outlines for
Semiconductor Devices
NOTICE: Unless otherwise indicated, all documents
cited shall be the latest published versions.
4 Terminology
4.1 Definitions
NOTE 2: See SEMI G57 for leadframe features terminology.
4.1.1 burr height — maximum height of burr above the
plane which it protrudes, (see Figure 1).
Figure 2
Burr Height
1 Electronic Industries Association of Japan, available through:
Japan Electronics and Information Technology Industries
Association, 3rd Fl., Mitsui Sumitomo Kaijo Bldg. Annex 11, Kanda
Surugadai 3-chome, Chiyoda-ku, Tokyo 101-0062, Japan,
http://www.jeita.or.jp/eiaj/english/
2 JEDEC Solid State Technology Association (aka the Joint Electron
Device Engineering Council), 2500 Wilson Boulevard, Arlington, VA
22201-3834, USA. Telephone: 703.907.7560; Fax: 703.907.7583,
Website: www.jedec.org