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SEMI E115-0302 E © SEMI 2002 2 complex con j ugate of a load im pedance of 2.0 – j20 ohms woul d be 2.0 + j20 ohms. 5.2.2 device under test (DUT) — t he matching network to be tested. 5.2.3 harmoni c frequency — the harm…

SEMI E115-0302
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© SEMI 2002 1
SEMI E115-0302
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TEST METHOD FOR DETERMINING THE LOAD IMPEDANCE AND
EFFICIENCY OF MATCHING NETWORKS USED IN SEMICONDUCTOR
PROCESSING EQUIPMENT RF POWER DELIVERY SYSTEMS
This test method was technically approved by the Global Metrics Committee and is the direct responsibility
of the North American Metrics Committee. Current edition approved by the North American Regional
Standards Committee on March 30, 2002. Initially available at www.semi.org June 2002; to be published
July 2002. Previously published March 2002.
E
This document was editorially modified in May 2002 to correct an errata. A change was made in Section
1.1.
1 Purpose
1.1 The purpose of this document is to define a test
method used to determine the load impedance and
efficiency of matching networks used in RF power
delivery systems for semiconductor processing
equipment.
2 Scope
2.1 This document specifies the testing procedures and
test equipment required for determining the load
impedance and power efficiency of a matching network
based on the positions of the tuning elements in the
matching network.
2.2 The primary focus for this specification is
semiconductor processing equipment including, but not
limited to, the following tool types:
• Dry etch equipment,
• Film deposition equipment (CVD and PVD).
2.3 This standard does not address any safety or
performance issues related to RF emissions or electrical
codes (e.g., Underwriter’s Laboratory, Inc. (UL), the
National Electrical Code (NEC
), Federal
Communications Commission (FCC)). It is the
responsibility of the users of this standard to conform to
the appropriate local codes and regulations as applied to
this type of equipment, some of which are covered by
referenced documents.
2.4 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
3 Limitations
3.1 This standard addresses RF Matching Networks
used in RF systems that primarily operate in the
frequency range of 0.2–100 MHz. It does not address
higher frequency RF systems or microwave systems.
3.2 This standard is meant for analyzing matching
networks that are designed to operate at fixed frequency
with a 50-ohm input impedance.
3.3 International, national, and local codes, regulations
and laws should be consulted to ensure that the
equipment and procedures meet regulatory
requirements in each location.
4 Referenced Standards
4.1 SEMI Standards
SEMI E113 — Specification for Semiconductor
Processing Equipment RF Power Delivery Systems
4.2 IEEE Standards
1
IEEE-STD-383 — IEEE Standard for Type Test of
Class 1E Electrical Cables, Field Splices, and
Connections for Nuclear Power Generating Stations
4.3 Military Standards
2
MIL-PRF-39012D — General Specification for
Connectors, Coaxial, Radio Frequency
5 Terminology
5.1 Abbreviations and Acronyms
5.1.1 CVD — Chemical Vapor Deposition
5.1.2 PVD — Physical Vapor Deposition
5.1.3 VSWR — Voltage Standing Wave Ratio
5.2 Definitions of Terms
5.2.1 complex conjugate load impedance — the
complex conjugate load impedance has the same real
part of the load impedance and the negative of the
reactive part of the load impedance. For example, the
1 Institute of Electrical and Electronics Engineers, IEEE Operations
Center, 445 Hoes Lane, P.O. Box 1331, Piscataway, New Jersey
08855-1331, USA. Telephone: 732.981.0060; Fax: 732.981.1721
2 Available through the Naval Publications and Forms Center, 5801
Tabor Avenue, Philadelphia, PA 19120-5099, USA. Telephone:
215.697.3321

SEMI E115-0302
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complex conjugate of a load impedance of 2.0 – j20
ohms would be 2.0 + j20 ohms.
5.2.2 device under test (DUT) — the matching network
to be tested.
5.2.3 harmonic frequency — the harmonic frequencies
are defined as integer multiples of the fundamental
frequency. For example, the second harmonic of 13.56
MHz is 27.12 MHz.
5.2.4 “L” type matching network — this type of
network consists of a tuning element that is connected
to ground, which is often a variable capacitor, and
another tuning element that is in series with the output
connection. The series section of the “L” matching
network typically consists of an inductor and a
capacitor, one of which is variable.
5.2.5 load and tune position — for some matching
networks, the tuning elements are referred to as the
Load Position and the Tune Position. This terminology
is common for “L” type matching networks, which
have a tuning element that is connected to ground and
another tuning element that is in series with the output
connection. The Load Position corresponds to the
tuning element that is grounded and is associated with
matching to the real part of the load impedance. The
Tune Position corresponds to the tuning element that is
in series with the output and is associated with
matching to the reactive part of the load impedance.
5.2.6 load impedance — the load impedance is the
impedance to which a matching network is matched.
5.2.7 load impedance simulator — the Load
Impedance Simulator is a device that presents a load
impedance to which a matching network can match.
Details of a typical Load Simulator can be found in the
Related Information section of this test method.
5.2.8 matched input impedance — a matched load
impedance is defined as typically having a magnitude
of 50 ± 3.3 ohms at a phase angle of up to ± 3.8
degrees. In other words, the load is considered matched
if the reflection coefficient is no greater than 0.032 at
any phase angle.
5.2.9 matching network — the device used to
transform the impedance of the load (chamber/chuck)
to match the impedance of the generator/cable
assembly, which is typically 50 ohms.
5.2.10 power efficiency — the ratio of the power
exiting the matching network divided by the power
entering the matching network.
5.2.11 S-parameters — the scattering matrix used to
describe a network. The reflection coefficient is the
S11 parameter and the transmission coefficient is the
S21 parameter.
5.2.12 tuning element position — the position of the
tuning element is defined as the output voltage or
output encoder value that corresponds to the position of
a variable tuning element in a Matching Network. For
example, the voltage from a rotary potentiometer on the
rotating shaft of a variable capacitor (the “Tuning
Element”) would be referred to as the capacitor’s
“Position”. In this example, the position/voltage
corresponds to a certain shaft location or position.
6 Test Apparatus
6.1 RF Vector Network Analyzer — The Network
Analyzer is used to measure the load impedance and
efficiency of the matching network. The Network
Analyzer requires vector capability so that both the
magnitude of phase of the reflection coefficient and
transmission coefficient can be measured at the
operating frequency. The Network Analyzer shall have
an up-to-date calibration per the manufacturer.
6.2 Coaxial Output Adapter — An adapter to convert
the output connection of the matching network to a
standard coaxial interface is required for some of the
tests.
6.3 RF Adapters and Terminations — Various adapters
may be necessary to convert between different types of
coaxial connectors (e.g., type N to type HN adapters,
etc.). All adapters used shall have the same nominal
characteristic impedance as the system, which is
typically 50 ohms. For some measurements, additional
coaxial cable assemblies are used. These cable
assemblies shall also be of the same nominal
characteristic impedance as the system. Standard
terminations are also used, such as shorts, opens, and
precision 50-ohm loads.
6.4 RF Load Impedance Simulator — A device that
can be attached to the output of the DUT to act as a
load for the DUT is required for some of the
measurements. The load simulator shall have an
impedance range to match a minimum of 80% of the
tuning space of the matching network to be tested.
7 Safety Precautions
7.1 Work should be conducted in accordance with local
safety requirements and test device manufacturer
recommended safety procedures. The tests described in
this document involve using low output power test
instrumentation (typically less than 10 milli-Watt).
7.2 The area immediately surrounding the Test Setup
shall be keep free and clear of unnecessary equipment
and materials.

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8 Test Setup for Determining Load Impedance
and Efficiency
8.1 Two test methods are described for analyzing
matching networks. The first method for determining
the load impedance and efficiency measures the
complex conjugate of the load impedance and then
corrects for the matching network losses to determine
the load impedance and efficiency. A schematic of the
Test Setup is shown in Figure 1. The method uses a
Network Analyzer to measure the reflection coefficient,
which is related to the load impedance, and the
transmission coefficient, which is related to the
efficiency. The Test Setup for this approach consists of
the Network Analyzer, the matching network to be
tested (DUT), coaxial test cables, and the appropriate
adapters (if any) to connect the DUT to the Network
Analyzer.
8.2 The second method for determining the load
impedance and efficiency uses a Load Impedance
Simulator attached to the output of the matching
network. A schematic of the Test Setup is shown in
Figure 2. The Test Setup for this approach consists of
the Network Analyzer, the matching network to be
tested (DUT), the load simulator, coaxial test cables,
the appropriate adapter (if any) to connect the DUT to
the Network Analyzer, and the appropriate adapter to
connect the load simulator to the DUT.
8.3 Prior to making any measurements, the Network
Analyzer shall be turned on and allowed to warm up
before the testing is to take place. This time will allow
for electronics to come to a stable operating condition
for the measurements.
9 Test Procedure for Determining Load
Impedance and Efficiency
9.1 Two test procedures can be used to determine the
load impedance and efficiency of the matching
network. The first method is designed for “L” type
matching networks, where the losses are dominated by
the loss resistance of the inductor that is in series with
the load impedance. For the case where there are finite
losses in the shunt capacitor, the capacitor losses can be
lumped in with the inductor losses without introducing
significant error (usually less than 0.5% for typical
values of < 0.1 ohms). Lumping the total losses into an
overall series loss will also cause a slight shift in the
reactive part of the impedance, but the magnitude of the
shift is on the same order as the impedance
measurement uncertainty and can be ignored.
9.2 The second method is designed for other matching
network types and uses a load simulator to determine
the load impedance and efficiency.
9.3 Test Method 1 for Determining Matching Network
Load Impedance and Efficiency
9.3.1 This test method shall be used for “L” type
matching networks of the type shown schematically in
Figure 1, where the losses in the network are dominated
by the loss resistance of the inductor, RLOSS. The
efficiency for this type of matching network is given as
Eff =
RLOAD
RLOAD + RLOSS
(1)
where RLOAD refers to the real part of the load
impedance and RLOSS refers to the losses of the
matching network.
9.3.2 For this type of network, the real part of the
complex conjugate impedance, Re(Zout*), contains the
real part of the load impedance plus twice the loss
resistance, RLOSS.
Re(
Z
ou
t
*)
=
RLOAD + 2RLOS
S
(2)
9.3.3 The load impedance, therefore, is equal to the
complex conjugate impedance less twice the loss
resistance (along with the sign change of the reactive
part of the conjugate impedance). For example, if the
conjugate impedance is measured as 3 + j20 and
RLOSS is determined to be 0.5 ohms, then the load
impedance is 2 – j20 ohms.
9.3.4 The efficiency of the matching network and the
loss resistance, RLOSS, can be determined by
measuring both the transmission coefficient, S21, and
the reflection coefficient, S11, in the Test Setup shown
in Figure 1. Note that the reflection coefficient
measurement, S11, is equivalent to measuring the
complex conjugate impedance. If the matching
network is considered as a test load with an impedance
equal to the complex conjugate impedance, then the
loss resistance is found by measuring the efficiency of
the test load. This efficiency, Effm, can be expressed as
Effm =
Re(
Z
out*) − RLOSS
Re(Zout*)
(3)
where Re(Zout*) is the real part of the complex
conjugate load impedance, Zout*. The measured
efficiency, Effm, can be determined from the S21 and
S11 measurements (as shown later in this section).
Thus, the measurements of Re(Zout*) and Effm can be
used to determine RLOSS as
)1(*)Re( EffmZoutRLOSS −×
=
(4)
and the load impedance and power efficiency of the
matching network can then be determined from
Effc =
Re(
Z
out*) − 2RLOSS
Re(Zout*) − RLOSS
(5)