semi合集-English.pdf - 第6437页
3 SEMI G75.11-0 698 © SEMI 1 998 6.3 Dielectric con sta nt and dielect r i c d issipation factor sh ould be calculated by the following equation: ε = C x /C o tan δ = G x /2 π fC x w h ere : ε : dielectric constant tan :…

SEMI G75.11-0698 © SEMI 1998 2
Figure 2
Electrodes Formed on the Leadframe Tape
Figure 3
Electrode Connection

3
SEMI G75.11-0698 © SEMI 1998
6.3 Dielectric constant and dielectric dissipation factor should be calculated by the following equation:
ε
=
C
x
/C
o
tan
δ
= G
x
/2
π
fC
x
w
h
ere
:
ε
:
dielectric constant
tan
:
dielectric dissipation factor
C
x
:
capacity of measuring condenser
C
c
balances
C
o
:
electrostatic capacity for
ε
=1
calculated by the following equation using the area of
the main electrode and thickness of specimen
C
o
=
r
2
/3.6 t
where :
r
:
radius of main electrode
t
:
thickness of specimen
G
x
:
conductance of specimen calculated
by the following equation
G
x
=g
×
Sv/100
where :
g
:
conductance between "m" and "d"
of conductance shifter in Figure 1
Sv/100
:
resistance ration of conductance
shifter at balance
f
:
the frequency of measurement
:
the ratio of the circle's circumference
to its diameter
7 Related Documents
7.1 ASTM Specification
2
ASTM D 150-64T — Standard Test Methods for Dielectric Constant and Dissipation Factor of Insulating Materials
2 American Society of Testing and Materials, 100 Barr Harbor Drive, West Conshohoken, PA 19428-2959 (all cited standards may be found in
Volume 10.05 of the Annual Book of ASTM Standards)

SEMI G75.11-0698 © SEMI 1998 4
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.