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SEMI G46-88 © SEMI 1988 1 SEMI G46-88 TEST METHOD FOR THERMAL TRANSIENT TESTING FOR DIE ATTACHME NT EVA LU ATION OF INTEGRATED CIRCUITS 1 Introduction 1.1 Pur pose — Evalua tio n of sem i c o nd ucto r die attachment int…

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SEMI G45-93 © SEMI 1986, 1993 4
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SEMI G46-88 © SEMI 19881
SEMI G46-88
TEST METHOD FOR THERMAL TRANSIENT TESTING FOR DIE
ATTACHMENT EVALUATION OF INTEGRATED CIRCUITS
1 Introduction
1.1 Purpose — Evaluation of sem iconductor die
attachment integrity using the thermal transient
techniques as implemented by the Electrical Test
Method on either thermal test chips or active devices.
1.2 Rationale — Steady state thermal response (or
thermal resistance) and thermal transient response of
discrete semiconductor devices and integrated circuits
are sensitive to the presence of voids in the die
attachment material between the semiconductor chip
and package. These voids impede the flow of heat from
the chip to the substrate (package). Due to the
difference in the thermal time constants of the chip and
package, the measurement of transient thermal response
can be made more sensitive to the presence of voids
than can the measurement of steady state thermal
response. This is because the chip thermal time constant
is generally several orders of magnitude shorter than
that of the package. Thus, the heating power pulse
width can be selected so that only the chip and the chip
to substrate interface are heated during the pulse by
using a pulse width somewhat greater than the chip
thermal time constant, but less than that of the
substrate. Heating power pulse widths ranging from 10
to 400 milliseconds have been found to satisfy this
criterion. This enables the detection of voids to be
greatly enhanced, with the added advantage of not
having to heat sink the device under test. Thus, the
transient thermal response technique is less time
consuming than the measurement of thermal resistance
for use as a manufacturing screen, process control or
incoming inspection measure for die attachment
integrity evaluation.
1.3 References — The following documents are
recommended reading for reference and test method
standard description purposes:
SEMI G32 — Unencapsulated Thermal Test Chip
MIL-STD-883C
1
— Method 1012, Thermal
Characteristics
2 Definitions
The following symbols and terminology shall apply for
the purpose of this test method.
1 Military Standards, Naval Publications and Form Center, 5801
Tabor Avenue, Philadelphia, PA 19120
2.1 V
F
— the forward biased volta ge of the diode
junction within the Device-Under-Test (DUT) used for
junction temperature sensing.
2.2 V
Fi
— the initial V
F
value befo re application of
heating power.
2.3 V
Ff
— the final V
F
value after application of
heating power.
2.4 ∆V
F
— the change in the temp erature sensitive
parameter, V
F
, due to the application of heating power
to the DUT.
2.5 V
H
— the voltage applied to the DUT during the
heating time in order to cause power dissipation.
2.6 I
H
— the heating current result ing from the
application of V
H
to the DUT.
2.7 P
H
— the heating power pulse magnitude; product
of V
H
and I
H
.
2.8 t
H
— the duration of P
H
(applie d to the DUT).
2.9 I
M
— the measurement current used to forward
bias the temperature sensing diode junction for
measurement of V
F
.
2.10 t
MD
— measurement delay time can be defined in
one of two ways:
2.10.1 the time from the start of heating power (P
H
)
removal to the completion of the final V
F
measurement;
or
2.10.2 the time from the start of heating power (P
H
)
removal to the start of the final V
F
measurement time,
referred to as t
SW
.
2.11 t
SW
— sample window time du ring which final
VF measurement is made; applicable only if t
MD
definition 2.10.2 is used.
2.12 K — the temperature-sensitive parameter
temperature coefficient measured at IM in °C per
millivolt.
2.13 CU — the comparison unit consisting of ∆V
F
divided by I
H
, that is used to normalize the transient
thermal response for variations in power dissipation; in
units of mV/A.
2.14 T
J
— the device-under-test junction temperature.
2.15 ∆T
J
— the change in T
J
caused by the application
of P
H
for a time equal to t
H
.
SEMI G46-88 © SEMI 1988 2
2.16 σ
∆
— the standard deviation if the ∆V
F
results for
a given test condition.
2.17 σ
CU
— the standard deviation o f the CU results
for a given test condition.
3 Test Operation
The following paragraphs describe in conceptual detail
the operation of the test for integrated circuit thermal
response.
3.1 Set-Up — Shown in Figure 1 i s the set-up required
for testing either active devices or thermal test chips.
Figure 1a is used for those cases in which the TSP is the
junction isolation diode forward biased voltage.
Thermal test chips and test IC’s for which the junction
isolation diode is either not available, or desirable for
temperature sensing, can be handled by the set-up
shown in Figure 1b.
3.2 Apparatus — To implement either version of
Figure 1 requires the following apparatus:
3.2.1 A constant voltage source capa ble of adjustment
to the desired value of V
H
and able to supply the I
H
value drawn by the DUT.
3.2.2 A constant current source to su pply I
M
with
sufficient voltage compliance to turn the TSP junction
fully on.
3.2.3 An electronic switch capable o f switching
between the heating period conditions and measurement
conditions in a time frame short enough to avoid DUT
cooling during the transition; this typically requires
switching in the microsecond range.
3.2.4 A voltage measurement circuit capable of
accurately making the V
H
measurement within the t
MD
(or t
MD
plus t
SW
, depending on the definitions stated
previously) time frame with millivolt resolution.
3.3 Operation and Waveforms — The test begins with
the adjustment of I
M
and V
H
to the desired values. Then
with the electronic switch in position 1, the value of V
F
is measured. The switch is then moved to position 2 for
a length of time equal to t
H
and the value of I
H
is
measured. Finally, at the conclusion of t
H
, the switch is
again moved to position 1 and the V
F
value is measured
within a time period defined by t
MD
(or t
MD
plus t
SW
,
depending on the definitions stated previously). The
voltage and current sources are then turned off at the
completion of the test.
The voltage and current waveforms for the two versions
of Figure 1 are shown in Figure 2.
4 Test Procedure
The procedures below describe how to set up the test
conditions and determine the acceptance limits for
implementing the transient thermal test for die
attachment evaluation using the apparatus and
definitions stated above.
4.1 Initial Device Testing Procedu re — The following
steps describe in detail how to set up the apparatus
described previously for proper testing of various
integrated circuit devices.
Step 1 — From a 10 to 15 piece sample of the
integrated circuits to be tested, pick any one device to
start the set-up process. Set up the test apparatus as
follows:
V
H
= 5.0 V (Or some other desired value near the
device under tests (DUT’s) normal operating
voltage.)
t
H
= 200 ms
t
MD
= 15 us
I
M
= 1.0 mA (Or some other value appropriate for
the specific device under test; typically in the range
of 80 uA to 9.9 mA.)
Step 2 — Insert device into the apparatus test fixture
and initiate a test.
(For best results, a test fixture that offers some form of
heat sinking would be desirable.)
Step 3 — If ∆V
F
is in the 20 to 40 mV range, then
proceed to the next step. This range corresponds to a
junction temperature change of roughly 10°C to 20°C
and is sufficient for initial comparison purposes.
If ∆V
F
is less than 20 mV, return to Step 1 and increase
heating power into device by increasing V
H
, or by
reconfiguring the DUT connections for greater power
dissipation, or a combination of both.
If ∆V
F
is greater than 80 mV, corresponding to a junc-
tion temperature change greater than 40°C, it would
probably be desirable to reduce the heating power by
returning to Step 1 and reducing V
H
, or by
reconfiguring the DUT connections to reduce power
dissipation, or a combination of the two. Reducing V
H
is the preferable approach.
Because two different devices can show the same rise
in junction temperature, even if the value of P
H
is
different, a comparison of the devices is best
accomplished using the CU value. As defined in
Section 2 above, CU provides a comparison unit that
takes into account different device I
H
values for a given
V
H
test condition.