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SEMI F28-1103 © SEMI 1997, 2003 6 6.3.4 Dynamic Test — This test is to immediately follow the static test. To condu ct the dynamic test, actuate the panel’s final process outlet valve at the rate of 1 cycle/m inute for 6…

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SEMI F28-1103 © SEMI 1997, 2003 5
6.3.1.1 The test flow rates stated in the above table are
meant to serve as a general guideline. The actual test
flow rates may vary depending on the maximum panel
flow rate as recommended by the manufacturer. The
maximum test flow rate should be the manufacturer’s
maximum recommended flow rate. If no such
maximum flow rate is recommended by the
manufacturer, the flow rates in the above table should
be used.
6.3.2 Background Test — Ensure that all valves
depicted in Figure 1 are in the closed position. Connect
the spool piece to the purge gas inlet (C-2) and the
isokinetic sampler inlet. Ensure that the spool piece and
proper adapters are in place on the test apparatus. (C-1
should be capped at this time.)
6.3.2.1 Close valve V-3. Adjust the regulator (PCV-2)
until PI-5 indicates the appropriate pressure in Table 1.
Open valve V-3 and use FC-2 to establish the specified
test flow rate listed in Table 1. Measure the static
background count. Background count is established
when the counter has sampled a minimum of 74 SL (3
scf), and the arithmetic average during the last 74 SL (3
scf) of gas sampled is < 71 particles/m
3
(< 2
particles/scf). At a sample flow rate of 1.23 SLPM
(0.05 scfm), the time required is one hour. Ensure that
the background counts are stable or decreasing. If
background cannot be achieved after 147 SL (6 scf)
have been sampled, there may be a problem with the
counter or test apparatus.
6.3.2.2 Disconnect the spool piece from C-2 and
connect it to C-1. Cap C-2 at this point.
6.3.2.3 Open valve V-1 and close valve V-2. Adjust the
regulator (PCV-1) until PI-2 indicates the appropriate
supply pressure listed in Table 1. Open valves V-1 and
V-2 to establish flow. Using the flow control device
(FC-1) set the appropriate test flow rate listed in Table
1. Measure the static background count. Background
count is established when the counter has sampled a
minimum of 74 SL (3 scf), and the arithmetic average
during the last 74 SL (3 scf) of gas sampled is < 71
particles/m3 (< 2 particles/scf). At a sample flow rate of
1.23 SLPM (0.05 scfm), the time required is one hour.
Ensure that the background counts are stable or
decreasing. If background cannot be achieved after 147
SL (6 scf) have been sampled, there may be a problem
with the counter or test apparatus.
6.3.2.4 Actuate valve V-2 at 1 cycle per minute to
measure the background counts under dynamic test
conditions. Dynamic background count is established
when the counter has sampled a minimum of 74 SL (3
scf), and the arithmetic average during the last 74 SL (3
scf) of gas sampled is < 106 particles/m
3
(< 3
particles/scf). At a sample flow rate of 1.23 SLPM
(0.05 scfm), the time required is 1 hour. If dynamic
background cannot be achieved after 147 SL (6 scf)
have been sampled, there may be a problem with the
counter or test apparatus.
6.3.3 Static Test — Using the flow control device (FC-
1), decrease the flow rate to 2.5–5.0 SLPM (0.1–0.2
scfm), so that some flow remains in the system while
the test component is installed.
6.3.3.1 Remove the spool piece by first disconnecting
the downstream fitting and then the upstream fitting.
Immediately install the test panel with all of the process
valves in the fully-open position by first connecting the
process gas inlet (C-3) fitting and then the process
outlet fitting. Uncap C-2 and connect it to the purge gas
inlet (C-4) connection of the panel with V-3 in the
closed condition. In order to minimize atmospheric
contamination and prevent the counter from cooling off,
removal of the spool piece and installation of the test
panel should take no longer than 2 minutes. Extreme
care should be taken to minimize contamination of the
test apparatus during this operation. The test panel is to
be removed from its inner bag in the Class 100 test
area. If the process outlet connection of the test panel
has mechanical fittings, these fittings are to be properly
connected. If the process outlet has butt weld tube
stubs, the connection is to be made with clean
compression fittings. Do not permanently crimp any
ferrules onto the tube stubs. Nylon ferrules are
acceptable. The purge gas inlet connection (C-4) should
also be connected at this time. The outlet vent
connection should be capped at this time. If this
connection is not capped by the manufacturer, it should
be covered with Aclar or Nylon 66 squares and taped so
as to insure against contamination by the immediate
environment. If applicable, all pneumatic valves should
be connected using the maximum recommended
actuator pressure as specified by the manufacturer.
6.3.3.2 Adjust the panel’s process regulator to obtain
the appropriate process outlet pressure as indicated in
Table 1. Using the flow control device (FC-1), increase
the flow to obtain the appropriate test flow rate as
indicated in Section 6.3.1.1
6.3.3.3 Turn on the counter and conduct the steady
state test. All of the valves on the process panel are to
be tested in a fully-open position until 74 SL (3 scf) of
gas have been sampled. Cumulative data should be
recorded at one-minute intervals.
NOTE 3: The flow rates in Table 1 represent the maximum
test flow rates. If a more thorough test is desired, the static
portion of the test should be repeated at intervals of 20%,
40%, 60%, and 80% of the full test flow rate. Testing at the
lower flow rates may in some instances be more indicative of
panel performance under actual use conditions.
SEMI F28-1103 © SEMI 1997, 2003 6
6.3.4 Dynamic Test — This test is to immediately
follow the static test. To conduct the dynamic test,
actuate the panel’s final process outlet valve at the rate
of 1 cycle/minute for 60 minutes. Each cycle consists of
having the valve in the open position for 58 seconds
and in the closed position for 2 seconds.
6.3.5 Cylinder Change Test — Close V-2, open V-3
and V-4, and adjust PCV-2 until PI-5 reads 3450 Kpag
(500 psig). Adjust the flow rate and pressure to the
vacuum venturi using FC-3 and PCV-3. The flow rate
and pressure should be set to the manufacturer’s
recommended values. Next perform a simulated
cylinder change purge and evacuation sequence
following the valve sequencing, dwell times, pressure
settings, etc. as specified by the manufacturer.
6.3.6 Final Steady State Test — Close V-4, V-3, and
open V-2. Repeat the step in Section 6.3.3.3.
6.3.7 Unregulated Flow Test (optional) — In some
instances, it may be desirable to test the panel with its
regulator in the fully-open position. Such a test will
give an indication of panel particulate performance
without the additional contribution of particles from an
operating regulator. In this instance, steps 6.3–6.3.5
should be repeated with the regulator in the wide open
condition.
6.4 Data Analysis and Reporting — The following test
conditions are to be reported in the data presentation:
1. Date and time of test
2. Operator
3. Test flow rate
4.Test pressures
5. Panel type, manufacturer, and serial number
6. Particle counter manufacturer, serial number, sample
flow rate, model number, specified particle size
sensitivity, and calibration date
7. Test gas type and dew point
8. A schematic of the test apparatus, including
manufacturer’s and model numbers of all test
apparatus components
9. Calibration dates for all instrumentation.
6.4.1 Data Presentation — Graph the static and
dynamic portions of the test separately as counts/minute
(measured by the counter) versus time, including the
appropriate background (measured with the spool piece
in place) with each. Also graph the entire data set as
counts per minute versus time.
6.4.1.1 Present the entire raw data set in tabular form.
6.4.2 Data Reduction — The statistical analysis is
based on the assumption that the particles generated are
randomly distributed and are statistically independent
of each other. The background counts are independent
of the particle performance of the component. The
particle counts observed from the test include the
counts from the component and the background count.
Let:
X
B
=
average background particle count
X
t
=
average total particle count from test
X
c
=
average particle count generated by the test component
Therefore,
X
t
=
X
c +
X
B
6.4.2.1 A statistical analysis of the data is performed to
determine the mean, standard deviation, and the
standard error for each particle size range.
6.4.2.2 The sample mean, X, or average of the data for
each state is given by:
X
=
X
i
n
i= 1
n
where X
i
is the observed counts for the state and n is the
number of samples.
6.4.2.3 The sample standard deviation is a measure of
the variability of the data about the mean. The standard
deviation, s, for each state is expressed as:
s =
(Xi X
)
2
i=1
n
n 1
6.4.2.4 The standard error, Se or standard deviation of
the sampling distribution of the mean for each state is
given below:
Se =
s
n
6.4.2.5 The average particle count for the total number
of particles generated, or the sample mean, is an
estimation of the population mean. For a 95%
confidence level, the population mean, µ
p
, will be
within two standard errors of the sample mean, or:
µ
p
= X ± 2 Se
SEMI F28-1103 © SEMI 1997, 2003 7
6.4.2.6 In order to determine if there is statistical
evidence of the component having an effect on the
observed particle count, a test must be conducted to see
if the actual difference between the average background
count, X
B
, and the average test count, X
t
, exceeds two
standard errors in a distribution of differences between
means. The average particle count generated by the test
component, X
c
, is given by:
X
c =
X
t
X
B
6.4.2.7 The standard error in a distribution of
differences between means is expressed as:
S
ec
= S
et
2
+ S
eB
2
6.4.2.8 The 95% confidence interval of the test
component itself is then determined by:
X
c ± 2 S
ec
6.4.2.9 If this confidence interval includes 0, then this
implies that there is not strong statistical evidence of
the component having an effect on the observed particle
count. If this interval does not include 0, then this
implies there is strong statistical evidence that the
component does have an effect on the observed particle
count.
6.4.2.10 Present in tabular form the average particle
count and the associated upper and lower confidence
limits (as calculated in Section 6.4.2) for each test state.
In addition, present the background test data separately
as a distinct element.
7 Related Documents
Agarwal, J. K. and Sem, G. J., “Continuous Flow,
Single Particle Counting Condensation Nucleus
Counter”, Journal of Aerosol Science, v.11.4. July
1950: 343–357
Fissan, H. and Schwientek, “Sampling and Transport of
Aerosols”, TSI Journal of Particle Instrumentation,
v.2.2. July–December 1987: 3–10
Hinds, W. C. Aerosol Technology: “Properties,
Behavior, and Measurement of Airborne Particles”,
John Wiley & Sons. 1982: 187–194
VanSlooten, R. A., “Statistical Treatment of Particle
Counts in Clean Gases”, Microcontamination, v.4.2.
February 1986: 32–38
ANSI/ASME B46.1
2
— “Specification for Surface
Texture - Surface Roughness, Waviness, and Lay
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