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SEMI D30-1101 © SEMI 2001 2 6.2 Measuring and Ins pection Dev ices 6.2.1 Color Illumin ator — T his light source shall have chromaticity, color rendering, luminance a nd intensity uniformity, diffus ion, and a sufficient…
SEMI D30-1101 © SEMI 20011
SEMI D30-1101
TEST METHOD FOR LIGHT RESISTANCE IN FLAT PANEL DISPLAY
(FPD) COLOR FILTERS
This test method was technically approved by the Global Flat Panel Display Materials and Components
Committee and is the direct responsibility of the Japanese Flat Panel Display Materials and Components
Committee. Current edition approved by the Japanese Regional Standards Committee on August 3, 2001.
Initially available at www.semi.org September 2001; to be published November 2001.
1 Purpose
1.1 The purpose of this document is to standardize the
method for measurement of light resistance in color
filters used for flat panel displays (FPD).
2 Scope
2.1 This method is to be used by suppliers and users of
FPD color filters to measure quality in products as well
as items under development.
2.2 This method shall be used in general FPD
production to test the resistance of color filters to light.
2.3 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the user of this standard to establish
appropriate safety and health practices and determines
the applicability of regulatory limitations prior to use.
3 Referenced Standards
3.1 SEMI Standards
SEMI D19 — Test Method for Chemical Resistance of
FPD Color Filter
SEMI D22 — Test Method for the Determination of
Color, Transmittance of FPD Color Filter Assemblies
3.2 JIS Standards (available in Japanese only)
1
JIS B7751 — Light-exposure and light-and-water-
exposure apparatus (Enclosed carbon-arc type)
3.3 ISO Standards
2
ISO 4892 — Methods of exposure to laboratory light
sources
ISO 7724
3
,
4
— Paints and varnishes -- Colorimetry
1 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-
ku, Tokyo, 107-8440 Japan. Tel: +81-3-3583-8000, E-mail:
webmaster@jsa.or.jp, http://www.jsa.or.jp
2 International Organization for Standards(ISO), 1, rue de Varembe,
Case, postale 56 CH-1211 Geneva 20, Switzerland. Tel: +41-22-749-
01-11, E-mail: central@iso.ch, http://www.iso.ch
3 Available in Japanese as JIS Z8730 — Method for Specification of
Color Differences for Opaque Material.
4 The expression method of its colour differences is equal to the
method defined in Publication of CIE No. 87 (1990) Parametric
NOTE 1: Unless otherwise indicated, all documents cited
shall be the latest published versions.
4 Terminology
4.1 atomic force microscope (AFM) — a device which
precisely measures surface shape by gauging the
reciprocal active force between atoms through use of a
probe.
4.2 fade meter — a device which tests for the existence
of external change or characteristics in materials by
long term irradiation using fixed brilliance from a
prescribed light source.
5 Summary of Method
5.1 Measure spectral transmittance, chromaticity, and
surface shape of specimen.
5.2 Place specimen in light exposure apparatus and
irradiate for specified length of time.
5.3 Remove specimen from light exposure apparatus.
5.4 Observe visually and by microscope to see if any
exterior changes have occurred in the specimen.
5.5 Measure spectral transmittance, chromaticity, and
surface shape of specimen.
6 Apparatus
6.1 Light Exposure Apparatus — Choose a test device
to use from the following devices and specify which
device was used in the report.
6.1.1 Carbon-arc Fade Meter
6.1.2 Sunshine Carbon-arc Fade Meter
6.1.3 Xenon-arc Fade Meter
Effects in Color – Difference Evaluation. Commission Internationale
de l’Eclairage, Kegelgasse 27, A-1030 Vienna, Austria. Tel: +43-1-
714-31-87-0
SEMI D30-1101 © SEMI 2001 2
6.2 Measuring and Inspection Devices
6.2.1 Color Illuminator — This light source shall have chromaticity, color rendering, luminance and intensity
uniformity, diffusion, and a sufficient illumination area for observation of the specimen to be measured (See SEMI
D19).
6.2.2 Floodlight — This light shall have luminance uniformity and an illumination area sufficient for the specimens
to be measured (See SEMI D19).
6.2.3 Microscope — Use a microscope which has either transmitted illumination or reflected illumination, or both,
and has a sufficient magnification ratio (See SEMI D19).
6.2.4 Spectrophotometer — The spectrophotometer shall be in conformance with SEMI D22.
6.2.5 Surface Shape Measurement Device — Use a Stylus-type surface roughness measurement (film thickness
measurement) device, AFM or laser microscope.
7 Test Conditions
7.1 The principle test conditions are described in Table 1. In the case where tests are performed under conditions in
addition to these, clearly state those conditions.
Table 1 Test Conditions
Item Device Test Interval Color Filter
Condition
Evaluation Item Reference
Standard
1 Carbon-arc Fade Meter
100 hrs.
± 5%
2 Sunshine Carbon-arc Fade Meter
100 hrs.
± 5%
3 Xenon-arc Fade Meter
500 hrs.
± 5%
With/Without
ITO
Glass Surface
Irradiation
With UV-cut
Filter
1. External Change
2. Color Difference
∆E*ab or ∆E*uv
3.Transmittance
Change
JIS B7751
ISO 4892
ISO 7724
8 Test Specimen
8.1 Use FPD color filters for specimens. In the test results, note the existence or non-existence of Transparent
Conductive Film (ITO etc.). Specimen used in the test are cut to an appropriate size for the specified holder of the
equipment above, and fastened at the specified distance from the light source. At this time, in order to test in
conditions close to actual use, an UV-cut filter is attached to the glass surface, and light is radiated from UV-cut
filter side.
9 Procedure
9.1 Turn on the light source of the light exposure apparatus and stabilize it.
9.2 Measure the spectral transmittance, chromaticity, and surface shape of each color layer of the specimen. (The
measurement method is described in Sections 9.6 and 9.7.)
9.3 Mount the specimen in the light expose apparatus.
9.4 Radiate light on the specimen for the prescribed length of time. In order to keep the brilliance of the light source
uniform over this period of time, control the light source according to the procedures accompanying your inspection
device.
9.5 Remove the specimen from the light exposure device.
9.6 Inspect the change of the outlook and the profile of the specimen according to the following procedures.
9.6.1 Observe the existence of peculiar changes in exterior appearance before and after each test (e.g. wrinkles,
cracks, color “mura” etc.).
9.6.1.1 Visual observation by a color illuminator from backside.
SEMI D30-1101 © SEMI 20013
9.6.1.2 Visual observation by a floodlight from front
side.
9.6.1.3 Microscope observation of color filter with
transmitted illumination.
9.6.1.4 Microscope observation of color filter with
reflected illumination.
9.6.1.5 Surface roughness measurement using a stylus-
type surface roughness measurement device, AFM or
laser microscope.
9.7 Measure the color changes according to the
following procedures.
9.7.1 Measure the spectral transmittance and
chromaticity of each color layer after the light
resistance test using the method described in SEMI
D22. (Measurements must be taken at the same
location as before the test.)
9.7.2 Before and after the test, calculate the color
difference ∆E*ab or ∆E*uv, in each color layer,
according to ISO 7724, from the chromaticity of each
color layer.
10 Reporting Results
10.1 Report the following items:
10.1.1 report date,
10.1.2 test date,
10.1.3 light exposure apparatus type and conditions of
use,
10.1.4 condition of specimens (with/without
Transparent Conductive Film (ITO etc.), size, etc.),
10.1.5 conditions of test (light source, brilliance, length
of time, etc.),
10.1.6 existence of change in outward appearance,
10.1.7 chromaticity of each color layer before and after
thermal treatment (number of measuring points),
10.1.8 color difference of each color layer before and
after thermal treatment, and
10.1.9 change in spectral transmittance at specified
wavelength (e.g. back-light peak wavelength, etc.).
11 Related Documents
11.1 SEMI Standards
SEMI D13 — Terminology for FPD Color Filter
Assemblies
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