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SEMI P12-0997 © SEMI 1991 , 1997 1 SEMI P12-0997 DETERMINA TION OF IRON, ZINC, CA LCIUM, M A GNESIUM, COPPER, BORON, ALUMI NUM, CHROMIUM, MANGANESE, AND NICKEL IN POSITIVE PHOTORESISTS BY INDUCTIVELY COUPLED PLASMA EMISS…

SEMI P11-0997 © SEMI 1991, 19971
SEMI P11-0997
DETERMINATION OF TOTAL NORMALITY FOR ALKALINE
DEVELOPER SOLUTIONS
1 Scope
1.1 An acid-base potentiometric titration to single or
multiple inflection points is performed on an automatic
recording titrator using standardized hydrochloric acid
as the titrant. The normality (meq/mL) is then
calculated by the titrator using the data obtained.
2 Apparatus
2.1 Autotitrator
2.2 Glass combination electrode
2.3 Class A grade volumetric pipets in 1 to 25 mL
sizes
2.4 250 mL beakers
3 Reagents
3.1 1.0 N Hydrochloric acid (from concentrate or
ready to use 1.0 N)
3.2 Primary Standard — High-purity sodium
carbonate is available from most chemical supply
houses, but must be dried at 400 degree centigrade
before use. TMAH (tris (hydroxymethyl)
aminomethane) is also available from the National
Institute of Standards and Technology (Standard
Reference Material 723a) for this purpose.
3.3 Buffer solutions, pH 4.0, 7.0, 10.0.
4 Procedure
4.1 Standardize the 1.0 N Hydrochloric acid with the
primary standard.
4.2 Standardize the titrator by performing a two point
calibration with pH 4.0, 7.0, and 10.0 buffer.
4.3 Pipette an appropriate aliquot (1 to 25 mL) of
sample into a 250 mL beaker containing a magnetic stir
bar. Sample size should be determined according to the
expected normality and the amount of titrant to be
dispensed that will give the optimum precision and
accuracy. Generally this is between one-half and three-
quarters the capacity of the burette. (See the instrument
manual for the recommended optimum range.)
4.4 Add deionized water to bring the volume to
approximately 150 mL.
4.5 Without delay (to prevent carbon dioxide
absorption), begin stirring without a vortex and titrate
to beyond the inflection endpoint.
4.6 Determine the exact endpoint and record the
volume of titrant consumed at the middle of the
inflection endpoint. This will be done automatically on
most newer digital titrators. On analog titrators, the
inflection point can be determined by using the first
derivative mode, or accurately determining the middle
of the inflection.
5 Calculation
5.1 Calculate the normality of the sample by the
following equation.
N
ormality (N) =
Volume of titrant (mL) × Normality of titrant (N.HCL)
Sample Volume (mL)
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI P12-0997 © SEMI 1991, 19971
SEMI P12-0997
DETERMINATION OF IRON, ZINC, CALCIUM, MAGNESIUM, COPPER,
BORON, ALUMINUM, CHROMIUM, MANGANESE, AND NICKEL IN
POSITIVE PHOTORESISTS BY INDUCTIVELY COUPLED PLASMA
EMISSION SPECTROSCOPY (ICP)
1 Scope
1.1 This procedure is an ICP plasma emission analysis
for determination of iron, zinc, calcium, magnesium,
copper, boron, aluminum, chromium, manganese, and
nickel in photoresist. The applicable concentration
range is 0.1 to 1 ppm when the sample is diluted 1 to 4.
The precision was found to be within 0.1 ppm in a
round robin analysis between four laboratories.
2 Spectrometer
2.1 A grating instrument with resolution sufficient to
separate the analytical emission lines in Table 1 is
required.
Table 1 Analytical Lines of the Elements
Elements
Analytical
Line, nm Elements
Analytical
Line, nm
Aluminum 309.271 Magnesium 285.213
Calcium 317.933 Nickel 231.604
Copper 324.754 Zinc 213.856
Iron 239.562 Chromium 283.563
Boron 208.960 Manganese 257.610
3 Sample Preparation
3.1 The sample is diluted 1/4 (1 part of sample plus 3
parts of solvent weight/weight) in 2-methoxyethanol or
another suitable solvent for positive resist. The solvent
should contain less than 0.03 ppm of the above
elements.
4 Standards
4.1 The standards should be weight/weight (mg/kg)
and should be diluted weight/weight since results will
be expressed in mg/kg.
4.2 The standards are prepared by diluting a
concentrated standard of organic-soluble metals in 2-
methoxyethanol or other suitable solvent. For example,
a 500 ppm standard is diluted to 50 ppm with xylene.
This solution is then diluted to 0.25 ppm with 2-
methoxythanol.
5 Plasma Conditions
5.1 The sample is pumped on the region of 0.7
mL/min, usually with a perstaltic pump attached to the
nebulizer. Choose a tubing that is not attacked by
methyl cellosolve (for example, polytetrafluoro-
ethylene). The argon plasma flow rate and RF power
should be optimized for the sample using settings
recommended in the manufacturer’s manual. Generally,
a plasma gas flow rate of 16 1/min. is necessary to
ionize organic solutions and an RF power of 1.7 watts
is required.
6 Quantitation
6.1 The detector gain is set by measuring the 0.25 ppm
standard. The background is measured with the solvent
and several sample measures. The standard and blank
should be run intermittently to satisfy reasonable
precision. Standard and sample readings should be
repeatable within 0.03 ppm. The effect of sample
viscosity on delivery of diluted resist to the plasma was
not found to be a factor for the resist tested for this
procedure. This effect can be checked by adding an
internal standard of an element known not to be present
in the resist (such as Yttrium) at ppm and checking the
emission response vs. external 1 ppm Yttrium standard
in the diluting solvent.
7 Calculation
7.1 ppm element (mg/kg = ppm measured × delution
factor (weight/weight)
7.2 Detection Limit — The detection limit is a
function of the dilution factor and can vary by
instrument. The dilution factor should be taken into
account in calculation of detection limit.
7.2.1 Detection limit (ppm) = s × dilution factor where
s = standard deviation of instrument readings in ppm.

SEMI P12-0997 © SEMI 1991, 1997 2
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.