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SEMI C3.24-03 01 © SEMI 1984 , 2001 3 NOTICE: T hese standards do n ot purport to address safety issues, if any, as sociated with their use. It is the responsibility of the user of these sta ndards to establish appropria…

SEMI C3.24-0301 © SEMI 1984, 2001 2
50 mL high-density polyethylene bottles
Assorted Class A volumetric flasks
Ion chromatograph
Anion column which separates:
F
-
, Cl
-
, Br
-
, SO
4
-2
, PO
4
-3
4.2.2 Ion Chromatograph Parameters:
Instrument: Dionex 2000 (or equivalent)
Integrator: Dionex 4270 (or equivalent)
Column: HDIC AS4A (or equivalent)
Eluent: 0.001 M Na
2
CO
3
+ 0.001 M NaHCO
3
Flow Rate: 2 mL/minute
Pressure: 960 psia
Detector
Conductivity
Range:
3.0 microsiemens for less than 10 ppm
Sample: 100 microliters
4.2.3 Calibration — Calibrate the ion chromatograph
by dissolving a weighed amount of ammonium fluoride
(NH
4
F) in deionized water and sequentially diluting it
to a fluoride concentration of 0.1 ppmw in Class A
volumetric flasks and analyzing it as specified by the
instrument manufacturer.
4.2.4 Operating Procedure
4.2.4.1 Prepare a fresh solution of 1.7 mM sodium
bicarbonate in deionized water.
4.2.4.2 Pipet 200 mL of the solution into a 500 mL
Greenburgh impinger.
4.2.4.3 Bubble approximately 20 L of sulfur
hexafluoride (SF
6
) through the solution, using the
delivery system shown in Figure 1.
4.2.4.4 Analyze the solution as specified by the
instrument manufacturer.
4.2.4.5 Calculation — Calculate the concentration of
hydrogen fluoride (HF) using the following formula:
ppmv HFg =
(F
-
ppmw)×Vg
19.00×mg
Where:
F
-
ppm = Fluoride concentration in trapped solution.
Vg = Volume of collection solution (mL).
mg = Moles of SF
6
bubbled through the collecting
solution.
19.00 = Molecular weight of F
-
.
The result may not exceed the specification in Section 2
of this Standard.
4.3
Water — This procedure is for the determination
of trace moisture (water) in sulfur hexafluoride using a
continuous flowing electrolytic hygrometer. (See Notes
4, and 5.)
4.3.1
Detection Limit — 1.0 ppm (vol/vol) or -76°C
(-105°F).
4.3.2 Sample Pressure and Flow — Set in accordance
with instrument manufacturer’s instructions.
4.3.3 Operation Check — Check the instrument
periodically for correct operation. A gas containing a
known amount of moisture should be passed through
the instrument. Agreement between the hygrometer and
the standard should be within their relative accuracies.
4.3.4
Operating Procedure
4.3.4.1 Obtain a continuous flow samp le of sulfur
hexafluoride source, using a clean, electropolished or
passivated stainless steel line which has been purged
dry after exposure to ambient moisture. (See Note 5.)
4.3.4.2
After prepurging with a dry gas, allow the
sample gas to flow through the sampling system and
hygrometer until a stable reading is obtained. The
reading may not exceed the specification in Section 2 of
this Standard.
4.4
Notes
NOTE 1: Introduce the calibration standard as many times as
necessary to achieve the desired precision.
NOTE 2: All gases used in the analysis of the sample should
not contain more than 10% of the specified value of the
component of interest, unless otherwise stated.
NOTE 3: Observe proper safety procedures for handling and
disposing of sulfur hexafluoride (SF
6
).
NOTE 4: The sampling system and hygrometer must be
designed to operate at the sample pressure, or the sample
pressure must be reduced (by a regulator with a diaphragm of
stainless steel or other suitable material) to accommodate the
pressure restrictions of the hygrometer.
NOTE 5: A passivation procedure is described in Metals
Handbook, Eighth Edition, Volume 2, ASM International,
Metals Park, Ohio.
Figure 1

SEMI C3.24-0301 © SEMI 1984, 20013
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials or
equipment mentioned herein. These standards are
subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI C3.26-0301 © SEMI 1984, 20011
SEMI C3.26-0301
SPECIFICATION FOR TUNGSTEN HEXAFLUORIDE (WF
6
) IN
CYLINDERS, 99.8% QUALITY
This specification was technically approved by the Global Gases Committee and is the direct responsibility of
the North American Gases Committee. Current edition approved by the North American Regional Standards
Committee on November 22, 2000. Initially available at www.semi.org January 2001; to be published March
2001. Originally published in 1984; previously published in 1994.
1 Description
1.1 Tungsten hexafluoride is a colorless gas or
colorless liquid. It is shipped as a liquefied gas under
its own vapor pressure.
2 Specifications
QUALITY: 99.8%
Impurities
Maximum Acceptable
Level (ppm) (See NOTE 1.)
Carbon Tetrafluoride (CF
4
)10
Hydrogen Fluoride (HF) 1000
Nitrogen (N
2
)50
Oxygen (O
2
) + Argon (Ar) 50
Sulfur Hexafluoride 10
Silicon Tetrafluoride 10
TOTAL LISTED IMPURITIES 1130
NOTE 1: An analysis of significant figures has not been considered.
The number of significant figures will be based on analytical
accuracy and the precision of the provided procedure.
3 Physical Constants (for in formation only)
Metric Units US Units
Molecular weight 297.85 297.85
Boiling point at 1 atm 17.1°C 62.8°F
Density of gas at 22.8°C
(73°F) and 1 atm
12.9 kg/m
3
0.805 lb/ft
3
Specific gravity of gas 10.8 10.8
Density of liquid at boiling
point
3440 kg/m
3
214.8 lb/ft
3
4 Analytical Procedures (Se e Notes 1, 2, 3, 4,
5, 6, 7)
4.1 Nitrogen and Oxygen + Argon — This procedure
is for the determination of nitrogen and oxygen + argon
in tungsten hexafluoride using a gas chromatograph
with a thermal conductivity detector.
4.1.1 Detection Limits — 10 ppm (mol/mol) nitrogen,
and 10 ppm (mol/mol) oxygen + argon.
4.1.2 Instrument Parameters
4.1.2.1 Columns: (See Figures 1, 2)
Column 1: Porapak S, 80/100 mesh, 1.5 m (5 ft) by
6.4 mm (1/4 in) OD, 5.1 mm (0.2 in) ID, ss
or equivalent.
Column 2: Molecular sieve 5A, 80/100 mesh, 1.8 m
(6 ft) by 4.8 mm (3/16 in) OD, 3.7 mm
(0.147 in) ID, ss or equivalent.
4.1.2.2 Column Flow: 30 mL/min helium.
4.1.2.3 Sample Volume: 2 mL
4.1.2.4 Temperatures
Detector 70°C
Column 40°C
4.1.3 Calibration Standard — 50 ppm (mol/mol)
nitrogen, 50 ppm (mol/mol) oxygen, balance helium.
4.1.4 Operating Procedures
4.1.4.1 Determine the times for valve switching and
signal changes, and enter into the run table. An example
of a run table follows.
Time Position Function
0 min. 1 Purge sample through loop. Backflush
Porapak column. Connect MS column
to the TCD.
1 min. 2 Inject sample onto Porapak column.
Allow oxygen + argon and nitrogen to
elute from the Porapak column to the
MS column. Sequentially elute the
oxygen + argon and nitrogen from the
MS column to the TCD.
4 min. 1 Backflush Porapak column to vent for
8 minutes.
4.1.4.2 Set the valves in Position 1 (Figure 1).
4.1.4.3 Flow the calibration standard through the 10-
port valve. Analyze standard using the conditions
described above. Record retention times and peak areas.