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SEMI C15-95 © SEMI 1995, 2002 5 detail, because such a calculation can be m ade by applying proce dures described elsewhere. The accuracy required in validation will vary with the proposed application of the moisture sta…

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SEMI C15-95 © SEMI 1995, 2002 4
of the moisture generator, and to its operating
temperature.
If the background moisture concentration is B (ppb),
the concentration delivered by the moisture standard is
C (ppb) and the dilution factor x is given by
x =
flow of moisture standard
total flow
(1)
then c, the delivered moisture concentration is given (in
ppb) by
c = (1
x
)B +
xC
(2)
The accuracy of calibration will reflect the combined
accuracy of the standard and the dilution system,
together with the accuracy of the background
determination; all must be taken into account in any
statement of analytical uncertainty.
7.3 Changing the Range of Performance of a Moisture
StandardIf a moisture standard is based on some
device which is believed to deliver moisture at a
constant rate, such as a permeation or effusion tube, the
concentration range delivered by the moisture standard
may be changed by delivering a substantially different
flow of carrier gas. This usually requires changing a
mass flow controller or other flow control device inside
the standard for a flow controller of a different range.
This may be done provided the new flow controller' s
performance is verified by comparison with a reliable
flow standard.
The definition of dilution factor is revised to
x =
flow generated by original flow controller
flow generated by new flow controller
(3)
The background, B, is determined by removing the
permeation or effusion tube from the system and
capping off its point of connection, or by preventing the
source from delivering moisture by some other means.
The same equation for c applies as does the statement
regarding analytical uncertainty.
7.4 Validation at Intermediate Concentrations — It
may be desirable to validate a moisture standard at a
concentration below the detection limit of the primary
hygrometer, if that standard is to be used for very low-
level generation. For example, if a standard based on a
permeation device is intended to generate levels
between 0.5 and 5 ppb at flows of 1 to 10 slm, it could
be validated in the 0.5 to 5 ppm range using a frost-
point hygrometer by replacing the flow controller with
one operating between 1 and 10 sccm
1
. However, such
a flow controller may not be readily available and is
difficult to calibrate in any case. Instead, it is preferable
to use a flow controller operating between 50 and 500
sccm to generate concentrations between 0.1 and 1.0
ppm together with a secondary hygrometer having a
detection limit no higher than 50 ppb. This procedure is
acceptable, provided that
the secondary hygrometer has been validated with
a primary hygrometer at least at one point in the
range to be used for validation of the moisture
standard,
the moisture concentrations generated by the
standard and that observed by the secondary
hygrometer agree throughout the range of
validation of the standard.
This approach could lead to errors if the hygrometer
and the standard each exhibited a deviation from
predicted performance, but these deviations would have
to be the same and cancel, which is extremely unlikely.
In the case of operation in this mode, it will be
necessary to know the background level of the system
and use this as an input to the calculation of generated
moisture levels. To continue the example of a
permeation based system, if the permeation rate
determined by weight loss is P (ng/min), the flow rate
of carrier gas is F (sccm), K is a factor to convert
ng/min to sccm moisture, and B is the experimentally
determined background, then the generated moisture
level, c
gen
, is calculated according to
c
gen
=
KP
F
+ B (4)
For other moisture generation systems, it is similarly
possible to calculate the generated moisture level while
taking into account the background level of the system.
This assumes that the background moisture
concentration is constant, which is only approximately
true. Thus, in applying this approach, in addition to the
sources of error mentioned above, the estimate of
analytical uncertainty must also include the variation in
background moisture.
8 Validation Precision and Accuracy
This procedure does not explicitly consider the
estimation of the accuracy of a moisture standard in
1 It is assumed that, although flow controllers are calibrated using a
standard, no unusual measures are used to enable the full accuracy of
calibration to be achieved over the entire range of the flow controller.
In practice this means that a flow controller has a usable dynamic
range of 10-100% of its flow rating.
SEMI C15-95 © SEMI 1995, 2002 5
detail, because such a calculation can be made by
applying procedures described elsewhere. The accuracy
required in validation will vary with the proposed
application of the moisture standard and may be left to
the discretion of the user of the procedure. It is
recommended that a propagation of errors calculation
be carried out to estimate the accuracy of the validation.
If no such calculation is made, and the minimum
criteria of the procedure are followed, it is estimated
that a validated moisture generator may output moisture
levels which differ from the true values by up to 20%.
NOTICE: SEMI makes no warranties or
representations as to the suitability of the standards set
forth herein for any particular application. The
determination of the suitability of the standard is solely
the responsibility of the user. Users are cautioned to
refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
standards are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.
SEMI C52-0301 © SEMI 20011
SEMI C52-0301
SPECIFICATION FOR THE SHELF LIFE OF A SPECIALTY GAS
This specification was technically approved by the Global Gases Committee and is the direct responsibility of
the European Gases Committee. Current edition approved by the European Regional Standards Committee on
December 20, 2000. Initially available at www.semi.org January 2001; to be published March 2001.
1 Purpose
1.1 The purpose of this document is to define
terminology and to recommend minimum periods for
the shelf lives of specialty gases. It is meant to provide
consistency in terminology among gas suppliers and to
provide a general guideline for users of these gases.
2 Scope
2.1 This document applies to the shelf life of properly
packaged, filled and analyzed specialty gases as stored
or supplied by a specialty gas manufacturer or supplier.
In this document, shelf life is viewed from a quality
point of view. The document does not address safety
aspects associated with the prolonged storage of gases.
2.2 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
3 Referenced Standards
None.
4 Terminology
4.1 container — a lecture bottle, cylinder, cylinder
pack, drum or any other vessel which is used to supply
a specialty gas.
4.2 residual level — The amount of product, as a
fraction of the fill weight or fill pressure, which should
be left in a container in order to minimize the impact on
manufacturing processes of the higher level of
impurities in the last gas fraction from a container.
4.3 shelf life — the period of time for which the
specification of a gas is guaranteed by the supplier,
starting from the time of analysis. It defines the period
for which the supplier guarantees the actual level of
impurities, as analyzed, to remain at or below the
specification limit for a particular gas grade.
5 Requirements
5.1 Factors Affecting the Shelf Life of a Specialty Gas
— Shelf life is a function of the following factors:
a. Thermal stability of the gas
b. Quality of the container and valve
material selection
leak tightness
c. Time-dependent reactions between
gas and impurities
gas and packaging materials
d. Filling and analytical operations
e. Transport and storage conditions
f. Amount of product in the container
5.1.1 The integrity of the valve is a key factor
determining the shelf life of a gas, in particular for low
vapor pressure gases. Time dependent reactions can be
significantly reduced by purification of the gas to a
level where impurities no longer have a significant
effect over time, and by selection of proper packaging
materials. Chemical and physical treatment of the
internal container surface and/or passivation of this
surface before filling also reduces the effect of time-
dependent reactions. For material and gas compatibility
information, please refer to the individual SEMI gas
standards.
5.2 Classification of Specialty Gases on the Basis of
Shelf Life — While there are a large number of
specialty gases used in semiconductor manufacturing,
for the purpose of defining shelf lives, they can be
divided into four groups. It should be noted that for
example chemically reactive gases are sometimes
classified as non-reactive in the table below as the
classification is done from a shelf-life point of view
only.
5.2.1 Non-reactive — Under normal storage
conditions, these gases do not react with ambient air,
the packaging materials or the impurities commonly
found in the specialty gas.
5.2.2 Reactive — These gases react either with
ambient air or standard packaging materials.
5.2.3 Corrosive — These gases react with packaging
materials usually in the presence of traces of moisture.
5.2.4 Unstable — These gases are thermally unstable
and spontaneously decompose over time.