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SEMI F57-0301 © SEMI 200 0, 2001 10 RELATED INFORM A TI ON 1 THEORETICAL DYNAMIC CONCENTR ATION (TDC) NOTE: T his related inf o rmation is n ot an offic ial part of SEMI F57 and w as derive d from the work of the origina…

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SEMI F57-0301 © SEMI 2000, 20019
Table 7 Related Standards for Plastic Piping Materials
PP PVDF PVC PFA ECTFE
Materials PREN 12202-1
DIN 16774
ISO/DIS 15874-1
ASTM D4101
ISO 10931-1
ASTM D3222
PREN 1452-1
ASTM D1784
ASTM D3915
ASTM D3307 ASTM D3275
Pipes PREN 12202-2
DIN 8077
DIN 8078
ISO/DIS 15874-2
ISO 10931-2 PREN 1452-2 No standards No standards
Fittings PREN 12202-3
ISO/DIS 15874-3
ISO 10931-3 PREN 1452-3 No standards No standards
Valves DIN 3442-1
DIN 3442-2
DIN 3442-3
ISO 10931-4 PREN 1452-4 No standards No standards
Systems PREN 12202-5
ISO/DIS 15874-5
ISO/FDIS 10931-5 PREN 1452-5 No standards No standards
NOTE 1: See Related Documents Sections 12.2, 12.3, 12.4, and 12.5.
NOTICE: SEMI makes no warranties or representations as to the suitability of the standard set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant
literature respecting any materials mentioned herein. These standards are subject to change without notice.
The user’s attention is called to the possibility that compliance with this standard may require use of copyrighted
material or of an invention covered by patent rights. By publication of this standard, SEMI takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any item mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights, are entirely their own responsibility.
SEMI F57-0301 © SEMI 2000, 2001 10
RELATED INFORMATION 1
THEORETICAL DYNAMIC CONCENTRATION (TDC)
NOTE: This related information is not an official part of SEMI F57 and was derived from the work of the originating task force.
This related information was approved for publication by full letter ballot procedures on August 28, 2000.
R1-1 TDC Definition and Calculation
R1-1.1 For purposes of demonstrating a theoretical
mathematical relationship between the maximum
allowed static leach out values (provided in this
specification) and a corresponding concentration which
may result in a flowing stream, this related information
on Theoretical Dynamic Concentration (TDC) is being
provided.
R1-1.2 The Static Value as defined in this document
(see Section 7.3.4) is a measure of the weekly
accumulated mass transfer of contaminant (contaminant
flux per week) from the material being tested into static
ultrapure water (UPW). The value is calculated based
upon measurement of total leached mass of a
contaminant per unit area of the surface that was wetted
in the test apparatus. Since the duration of the static
test is fixed at 7 days, the information is simply
reported as mass/area (Tables 3, 4, and 5 use units of
µg/m
2
).
R1-1.3 The Theoretical Dynamic Concentration (TDC)
is a mathematical conversion of the static value into a
theoretical prediction of concentration of a contaminant
incorporated into the flowing liquid by contact with the
contaminant generating (or transmitting) polymer
component wall. The conversion depends upon a
model which assumes a uniform rate of contaminant
generation that is equal to the average rate over the 7
day Static Value test (7d * 24 hr/d * 3600 sec/hr = 6.05
x 10
5
sec). The model also assumes a non-depleting
source of the contaminant in steady state transport
conditions through the component/liquid interface. In
general, this assumption is only true early in the life of
the piping system installation. Values have been found
to decrease in time. Calculation of TDC for
specification limit purposes can be derived by dividing
the static value limit for the component (adjusted for
wetted surface area of the component) by the volume of
liquid affected by contact with the component.
R1-2 TDC Example
R1-2.1 Referring to the concentrations shown in Tables
3, 4 and 5, a 1 meter long, 60 mm inner diameter pipe
with an UPW constant fluid velocity of 1.5
meters/second is selected as an example. Since several
factors will affect the actual concentration in a flowing
stream the TDC should be considered as approximate,
not absolute.
I.D. d = 60 mm
Length l = 1.0 m
Fluid velocity = 1.5 m/sec
R1- 2.2 Example of TDC Calculation:
a) Surface area of tube I.D.
= πdl
= (π)(0.060 m)(1.0 m)
= 0.188 m
2
= 1.88 × 10
-1
m
2
b) Volume of tube I.D.
= π (d/2)
2
l
= (π)(0.060/2 m)
2
(1.0 m)
= 2.83 × 10
-3
m
3
= (2.83 × 10
-3
m
3
)(1 × 10
3
liter/m
3
)
= 2.83 liter
c) Volume of liquid transported through tube per
second
= (1.5 m/sec) (2.83 liter/m)
= 4.25 liter/sec
d) Volume of liquid transported through tube per
week
= (4.25 liter/sec)(6.05 x 10
5
sec/wk)
= 2.57 × 10
6
liter/wk
e) Assume a Static Value limit of 10µg/m
2
= (10 µg/m
2
)(1.88 × 10
-1
m
2
)
= 1.88 µg
f) Using the values from d and e, above,
TDC = 1.88 µg / 2.57 × 10
6
liter
TDC = 7.3 × 10
-7
µg/liter
(or, 7.3 × 10
-4
parts per trillion in liquids with an
approximate density of 1 gram/cm
3
)
SEMI F57-0301 © SEMI 2000, 200111
NOTICE: SEMI makes no warranties or
representations as to the suitability of the standard set
forth herein for any particular application. The
determination of the suitability of the standard is solely
the responsibility of the user. Users are cautioned to
refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
standards are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.