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SEMI G4-0302 © SEMI 1982, 2002 11 A PPENDIX 3 TEST METHOD FOR SLIT STRAIN OF LEA DFRA ME STRIPS USED FOR STA M PING NOTE: T he m aterial in this appendix is an official part of SEMI G4. A 3- 1 Preface A3-1.1 The method i…

SEMI G4-0302 © SEMI 1982, 2002 10

APPENDIX 2

TEST METHOD FOR SLITTER STRAIN OF STRIPS USED FOR

LEADFRAME STAMPING

NOTE: The material in this appendix is an official part of SEMI G4.

A2-1 Preface

This is related to the general evaluation method for

slitter strain of strips used for leadframe stamping. Such

distortion could result in adverse effects on leadframes,

such as coil set, lead twist, and camber.

A2-2 Evaluation Method

A2-2.1 Equipment — Tool microscope (×100).

A2-2.2 Procedure

A2-2.2.1 Collect flat samples approximately 150 mm

in length from strips in a way that residual distortion

can be overlooked. (Collection methods include wire

cutting, etching, refined cutting, etc.) Thickness of

samples should be either 0.25 mm, 0.20 mm, or 0.15

mm.

A2-2.2.2 Fashion each sample to the shape shown in

Figure A2-1 by etching or wire cutting. Measure with

the tool microscope to obtain coordinates of the leg end

corner. The reading accuracy is to 0.1 mm (see Note 1).

A2-2.2.3 Using the coordinates of the leg end corner,

for each leg obtain longitudinal curvature “A”, lead

twist “B”, and camber “C”, as shown in Figure A2-2

(see Note 2).

Note 1: Specify the direction of slit burr, and for legs in which

the longitudinal curvature A is reversed, measure by reversing

the sample itself.

Note 2: Measured values are marked as shown in Figure A2-

Note 3: This method should be applied to only slitter strain.

Do not apply to any other kind of strain (e.g., thermal inner

strain).

Base line for

measuring camber

Slit direction

Strip

width

Approx. 150 mm

100 mm

5 mm min.

0.2 ~ 1 mm

2 +

0.5 mm

Figure A2-1

Shape for Evaluation of Slitter Strain

Base line for measuring camber

Base line for measuring

longitudinal curvature A

Slit burr

Angle B

Figure A2-2

Evaluation Items

SEMI G4-0302 © SEMI 1982, 2002 11

APPENDIX 3

TEST METHOD FOR SLIT STRAIN OF LEADFRAME STRIPS USED

FOR STAMPING

NOTE: The material in this appendix is an official part of SEMI G4.

A3-1 Preface

A3-1.1 The method is used to evaluate the edge stress caused by slitting.

A3-1.2 This method is applied to thickness between 0.1 mm and 0.3 mm.

A3-2 Evaluation Method

A3-2.1 Equipment — Tool microscope (×100).

A3-2.2 Procedure

A3-2.2.1 A test piece of approximately 200 mm length is sawn, stamped, etched, wire cut, refined cut, etc., over a

length of 100–150 mm parallel to the rolling direction of a distance of 2–5 mm from the edge of the strip. (See

Figure A1-7.)

A3-2.2.2 The dislocation of the outer strips relative to the plane of the test piece measured as camber c, longitudinal

curvature L, and twist T characterize the internal edge stress. (Note 1)

Note 1: The details of the test method and the maximum admissible values of c, L, and T shall be agreed between purchaser and

supplier.

Figure A1-7

Test Method of Slit Stress

NOTICE: These standards do not purport to address safety issues, if any, associated with their use. It is the

responsibility of the user of these standards to establish appropriate safety and health practices and determine the

applicability of regulatory limitations prior to use. SEMI makes no warranties or representations as to the suitability

of the standards set forth herein for any particular application. The determination of the suitability of the standard is

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product data sheets, and other relevant literature respecting any materials mentioned herein. These standards are

subject to change without notice.

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the risk of infringement of such rights, are entirely their own responsibility.

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