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SEMI M23.4-0999 © SEMI 1999 1 SEMI M23.4-0999 SPECIFICATION FOR ROUND 100 mm POLISHED MONOCRYSTALLINE INDIUM PHOSPHIDE WAFERS FOR ELECTRONIC AND OPTOELECTRONIC DEVICE A PPLIC A TIONS (DOVE-TA I L TYPE) This specification…

SEMI M23.3-0600 © SEMI 1994, 20003
a
b
d
O. F.
I. F.
d = 5 mm
10 mm
a
b
O. F.
I. F.
d
d = 5 mm
15 mm
Figure A1-2
Rectangular Wafers Which can be Obtained from 50 and 75 mm Round Wafers
NOTICE: SEMI makes no warranties or representations as to the suitability of the standard set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant
literature respecting any materials mentioned herein. These standards are subject to change without notice.
The user’s attention is called to the possibility that compliance with this standard may require use of copyrighted
material or of an invention covered by patent rights. By publication of this standard, SEMI takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any item mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI M23.4-0999 © SEMI 19991
SEMI M23.4-0999
SPECIFICATION FOR ROUND 100 mm POLISHED
MONOCRYSTALLINE INDIUM PHOSPHIDE WAFERS FOR
ELECTRONIC AND OPTOELECTRONIC DEVICE APPLICATIONS
(DOVE-TAIL TYPE)
This specification was technically approved by the Global Compound Semiconductor Committee and is the
direct responsibility of the Japanese Compound Semiconductor Committee. Current edition approved by the
Japanese Regional Standards Committee on June 1, 1999. Initially available at www.semi.org August 1999;
to be published September 1999.
NOTE: The complete specification for this product includes all general requirements of SEMI M23.
Table 1 Dimension and Tolerance Requirements
Property Dimension Tolerance Units
DIAMETER (See NOTE 1.) 100.0 ± 0.5 mm
THICKNESS, CENTER POINT 625.0 ± 25 µm
PRIMARY FLAT LENGTH 32.5 ± 2 mm
SECONDARY FLAT LENGTH 18.0 ± 2 mm
NOTE 1: The diameter standard means that the dimension is centered to this value.
Table 2 Orientation and Flat Location Requirements
Property Requirement
OPTION Dove-Tail
PRIMARY FLAT ORIENTATION
) 1 1 (0 ± 0.5 (see Figure 1 in SEMI M23) under an indium facet. The primary
flat shall be perpendicular to the “Dove-Tail” etch figure (see NOTE 1).
SECONDARY FLAT ORIENTATION
) 1 1 0( 90°=± 5° clockwise from the primary flat.
SURFACE ORIENTATION
A.
(100) ± 0.5°=(See Figure 1 in SEMI M23.)
B.
(100) off 2° ± 0.5° toward the
0) 1 (1 plane (see NOTE 2).
(See Figure 2 in SEMI M23.)
ORTHOGONAL MISORIENTATION
± 5°=(See Figure 3 in SEMI M23.)
NOTE 1: Since there are various etchants, the appropriate etching method for revealing etch pits can be determined by each manufacturer. For
example, see reference “HBr-K
2
Cr
2
O
7
-H
2
O etching system for indium phosphide” J.L. Weyher et al., Materials Science and Engineering, B28
(1994) 488-492.
NOTE 2: The frame of reference is the (100) plane of the crystal. It is the wafer normal that is tilted toward the
0) 1 (1 plane of the crystal.
NOTICE: SEMI makes no warranties or representations as to the suitability of the standards set forth herein for
any particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant
literature respecting any materials mentioned herein. These standards are subject to change without notice.
The user’s attention is called to the possibility that compliance with this standard may require use of copyrighted
material or of an invention covered by patent rights. By publication of this standard, SEMI takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any item mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI M23.5-1000 © SEMI 20001
SEMI M23.5-1000
SPECIFICATION FOR ROUND 100 mm POLISHED
MONOCRYSTALLINE INDIUM PHOSPHIDE WAFERS FOR
ELECTRONIC AND OPTOELECTRONIC DEVICE APPLICATIONS (V-
GROOVE OPTION)
This specification was technically approved by the Global Compound Semiconductor Committee and is the
direct responsibility of the North American Compound Semiconductor Committee. Current edition approved
by the North American Regional Standards Committee on August 28, 2000. Initially available at
www.semi.org September 2000; to be published October 2000.
NOTE: The complete specification for this product includes all requirements of SEMI M23.
Table 1 Dimension and Tolerance Requirements
Property Dimension Tolerance Units
DIAMETER (See NOTE 1.) 100.0 ± 0.5 mm
THICKNESS, CENTER POINT 625 ± 25 µm
PRIMARY FLAT LENGTH 32.5 ± 2 mm
SECONDARY FLAT LENGTH 18 ± 2 mm
NOTE 1: The diameter standard means that the dimension is centered to this value.
Table 2 Orientation and Flat Location Requirements
Property Requirement
PRIMARY FLAT ORIENTATION
)101( ± 0.5° (see NOTE 1) under a Phosphorus facet. The primary flat shall be
perpendicular to the “V” etch figure. (See NOTE 2.)
SECONDARY FLAT ORIENTATION (011), 90°± 5° counterclockwise from the primary flat.
SURFACE ORIENTATION (See NOTE 3.)
A. { 100} (see
NOTE 1) ± 0.5° (See Figure 2 in SEMI M23.)
B. { 100} (see NOTE 1) off 2° ± 0.5° toward the (110) plane which is between the
primary and secondary flats (See Figure 4 in SEMI M23.)
ORTHOGONAL MISORIENTATION ± 5° (See Figure 5 in SEMI M23.)
NOTE 1: See Table 1 in SEMI M23.
NOTE 2: See Figure 2 in SEMI M23, which shows the orientation of the V-groove figure relative to crystallographically anisotropic pits (see
NOTE 4).
NOTE 3: The frame of reference is the (100) plane of the crystal. It is the wafer normal that is tilted toward the (110) plane of the crystal.
NOTE 4: Relating to the etchant used for identifying V-groove and/or dovetail direction, see reference: “HBr-K
2
Cr
2
O
7
- H
2
O etching system for
indium phosphide” J.L.Weyher, et al. Materials Science and Engineering B28 (1994) 488–492.
NOTICE: These standards do not purport to address safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish appropriate safety and health practices and determine the
applicability of regulatory limitations prior to use. SEMI makes no warranties or representations as to the suitability
of the standards set forth herein for any particular application. The determination of the suitability of the standard is
solely the responsibility of the user. Users are cautioned to refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature respecting any materials mentioned herein. These standards are
subject to change without notice.
The user’s attention is called to the possibility that compliance with this standard may require use of copyrighted
material or of an invention covered by patent rights. By publication of this standard, SEMI takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any item mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.